Microarchitecture parameter selection to optimize system performance under process variation

Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield of high-performance microprocessors in future process technology generations. This variability manifests itself by increasing the number and criticality of long delay paths. To quantify this impact, we use an architectural process variation model that is appropriate for the analysis of system performance in the earlystages of the design process. We propose a method of selecting microarchitectural parameters to mitigate the frequency impact due to process variability for distinct structures, while minimizing IPC (instructions-per-cycle) loss. We propose an optimization procedure to be used for system-level design decisions, and we find that joint architecture and statistical timing analysis can be more advantageous than pure circuit level optimization. Overall, the technique can improve the 90% yield frequen...

• Type: Conference
• Year: 2006
• Where: ICCAD
• Authors: Xiaoyao Liang, David Brooks
• Keywords: Architectural Process Variation, Hardware, ICCAD 2006, Process Technology Generations, Process Variability