3819 search results - page 28 / 764 » Predicting Dependability by Testing |
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
COLING
1996
13 years 9 months ago
1996
The paper is a first attempt to fill a gap in the dependency literature, by providing a mathematical result on the complexity of recognition with a dependency grammar. The paper d...
CAISE
2003
Springer
14 years 29 days ago
2003
Springer
Abstract. This paper presents a method to compute metrics that predict maintainability of a system with respect to its event processing. The metrics reflect the complexity of event...
EUROMICRO
2007
IEEE
13 years 9 months ago
2007
IEEE
BPEL is a de-facto standard language for web service orchestration. It is a challenge to test BPEL processes automatically because of the complex features of the language. The cur...
ICA
2004
Springer
14 years 1 months ago
2004
Springer
Abstract. In this paper we examine how the activation of one independent component analysis (ICA) feature changes first and second order statistics of other independent components...