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» Predicting When Not to Predict
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DFT
2008
IEEE
138views VLSI» more  DFT 2008»
14 years 2 months ago
Exploring Density-Reliability Tradeoffs on Nanoscale Substrates: When do smaller less reliable devices make sense?
It is widely recognized that device and interconnect fabrics at the nanoscale will be characterized by an increased susceptibility to transient faults. This appears to be intrinsi...
Andrey V. Zykov, Gustavo de Veciana
ICML
2008
IEEE
14 years 8 months ago
Training structural SVMs when exact inference is intractable
While discriminative training (e.g., CRF, structural SVM) holds much promise for machine translation, image segmentation, and clustering, the complex inference these applications ...
Thomas Finley, Thorsten Joachims
CHI
2005
ACM
14 years 8 months ago
Homophily in online dating: when do you like someone like yourself?
Psychologists have found that actual and perceived similarity between potential romantic partners in demographics, attitudes, values, and attractiveness correlate positively with ...
Andrew T. Fiore, Judith S. Donath
CHI
2004
ACM
14 years 8 months ago
If not now, when?: the effects of interruption at different moments within task execution
User attention is a scarce resource, and users are susceptible to interruption overload. Systems do not reason about the effects of interrupting a user during a task sequence. In ...
Piotr D. Adamczyk, Brian P. Bailey
ITC
2003
IEEE
118views Hardware» more  ITC 2003»
14 years 26 days ago
Method of reducing contactor effect when testing high-precision ADCs
— Being able to test the intrinsic performance of a device under test (DUT) has always been the main goal of a test engineer. Achieving this goal is becoming increasingly diffic...
Gwenolé Maugard, Carsten Wegener, Tom O'Dwy...