2 search results - page 1 / 1 » Predicting dynamic specifications of ADCs with a low-quality... |
ETS
2010
IEEE
14 years 4 months ago
2010
IEEE
— A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A noisy and nonlinear pulse is applied as the test stimulus, which is suitable for...
ICCAD
2003
IEEE
15 years 3 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...