— As CMOS technology enters the nanometer regime, the increasing process variation is bringing manifest impact on circuit performance. In this paper, we propose a Principle Hessi...
Alexander V. Mitev, Michael Marefat, Dongsheng Ma,...
Abstract—Analysis and verification environments for nextgeneration nano-scale RFIC designs must be able to cope with increasing design complexity and to account for new effects,...
Jorge Fernandez Villena, Wil H. A. Schilders, L. M...
The widely used engineering decisions concerning the performance of technological equipment for process industries are usually deterministic. Since the early 1990s probabilistic m...