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DAC
2005
ACM
13 years 10 months ago
Logic soft errors in sub-65nm technologies design and CAD challenges
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
Subhasish Mitra, Tanay Karnik, Norbert Seifert, Mi...
MVA
2007
162views Computer Vision» more  MVA 2007»
13 years 10 months ago
Geometrical and Statistical Visual Inspection of Imprinted Tablets
In this paper we address automated visual inspection of tablets that may, in contrast to manual tablet sorting, provide objective and reproducible tablet quality assurance. Visual...
Marko Bukovec, Ziga Spiclin, Franjo Pernus, Bostja...
SIGSAND
2008
13 years 10 months ago
Advanced Reduction Rules for the Verification of EPC Business Process Models
: Conceptual business process models such as Event-driven Process Chains (EPCs) play an important role in the business process management life cycle. The problem in this context is...
Jan Mendling, Wil M. P. van der Aalst
DGO
2006
113views Education» more  DGO 2006»
13 years 10 months ago
Progress in language processing technology for electronic rulemaking
In this project, we are developing new text processing tools that help people perform advanced analysis of large collections of text commentary. This problem is increasingly faced...
Stuart W. Shulman, Eduard H. Hovy, Jamie Callan, S...
PRIS
2004
13 years 10 months ago
Pattern Recognition Algorithms for Polyphonic Music Transcription
Abstract. The main area of work in computer music related to information systems is known as music information retrieval (MIR). Databases containing musical information can be clas...
Antonio Pertusa, José Manuel Iñesta ...