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ECCV
2006
Springer
14 years 10 months ago
A Learning Based Approach for 3D Segmentation and Colon Detagging
Abstract. Foreground and background segmentation is a typical problem in computer vision and medical imaging. In this paper, we propose a new learning based approach for 3D segment...
Zhuowen Tu, Xiang Zhou, Dorin Comaniciu, Luca Bogo...
VLSID
2010
IEEE
155views VLSI» more  VLSID 2010»
13 years 6 months ago
Synchronized Generation of Directed Tests Using Satisfiability Solving
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
Xiaoke Qin, Mingsong Chen, Prabhat Mishra
KDD
2000
ACM
211views Data Mining» more  KDD 2000»
14 years 6 days ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
FMCAD
2008
Springer
13 years 10 months ago
Automatic Non-Interference Lemmas for Parameterized Model Checking
Parameterized model checking refers to any method that extends traditional, finite-state model checking to handle systems arbitrary number of processes. One popular approach to thi...
Jesse D. Bingham
FORMATS
2003
Springer
14 years 1 months ago
Performance Analysis of Probabilistic Timed Automata Using Digital Clocks
Probabilistic timed automata, a variant of timed automata extended with discrete probability distributions, is a specification formalism suitable for describing both nondeterminis...
Marta Z. Kwiatkowska, Gethin Norman, David Parker,...