Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
Kristen R. Walcott, Greg Humphreys, Sudhanva Gurum...
Abstract. This paper presents KES (Knowledge Extraction and Summarization), a new knowledge-enhanced approach that builds a case memory out of episodic textual narratives. These na...
Automated software customization is drawing increasing attention as a means to help users deal with the scope, complexity, potential intrusiveness, and ever-changing nature of mod...
Abstract. We consider bicriteria optimization problems and investigate the relationship between two standard approaches to solving them: (i) computing the Pareto curve and (ii) the...
Static program checking tools can find many serious bugs in software, but due to analysis limitations they also frequently emit false error reports. Such false positives can easi...
Ted Kremenek, Ken Ashcraft, Junfeng Yang, Dawson R...