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ASPDAC
2007
ACM
98views Hardware» more  ASPDAC 2007»
13 years 11 months ago
A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura
CVPR
2004
IEEE
14 years 12 months ago
Invariant Operators, Small Samples, and the Bias-Variance Dilemma
Invariant features or operators are often used to shield the recognition process from the effect of "nuisance" parameters, such as rotations, foreshortening, or illumina...
Xiaojin Shi, Roberto Manduchi
MICAI
2007
Springer
14 years 4 months ago
Handling Constraints in Particle Swarm Optimization Using a Small Population Size
This paper presents a particle swarm optimizer for solving constrained optimization problems which adopts a very small population size (five particles). The proposed approach uses...
Juan Carlos Fuentes Cabrera, Carlos A. Coello Coel...
CORR
2008
Springer
82views Education» more  CORR 2008»
13 years 10 months ago
Adaptive Dynamics of Realistic Small-World Networks
Continuing in the steps of Jon Kleinberg's and others celebrated work on decentralized search, we conduct an experimental analysis of destination sampling, a dynamic algorithm...
Olof Mogren, Oskar Sandberg, Vilhelm Verendel, Dev...
TSE
2012
12 years 8 days ago
Does Software Process Improvement Reduce the Severity of Defects? A Longitudinal Field Study
— As firms increasingly rely on information systems to perform critical functions the consequences of software defects can be catastrophic. Although the software engineering lite...
Donald E. Harter, Chris F. Kemerer, Sandra Slaught...