129 search results - page 10 / 26 » Process Variations and their Impact on Circuit Operation |
VLSID
2008
IEEE
14 years 7 months ago
2008
IEEE
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
ISPD
2006
ACM
14 years 1 months ago
2006
ACM
Advances in VLSI technology make clock skew more susceptible to process variations. Notwithstanding efficient zero skew routing algorithms, clock skew still limits post-manufactu...
TCAD
2008
13 years 7 months ago
2008
Abstract--Advances in very large-scale integration technology make clock skew more susceptible to process variations. Notwithstanding efficient exact zero-skew algorithms, clock sk...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
: Double-Gate (DG) transistors have emerged as promising devices for nano-scale circuits due to their better scalability compared to bulk CMOS. Among the various types of DG device...
HPCA
2009
IEEE
14 years 2 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...