122 search results - page 11 / 25 » Process variability-aware transient fault modeling and analy... |
DSN
2004
IEEE
13 years 11 months ago
2004
IEEE
Recent developments in the field of object-based fault tolerance and the advent of the first OMG FTCORBA compliant middleware raise new requirements for the design process of dist...
CN
2004
13 years 7 months ago
2004
Launching a denial of service (DoS) attack is trivial, but detection and response is a painfully slow and often a manual process. Automatic classification of attacks as single- or...
INFOCOM
2002
IEEE
14 years 15 days ago
2002
IEEE
—This paper utilizes belief networks to implement fault localization in communication systems taking into account comprehensive information about the system behavior. Most previo...
ASPDAC
2001
ACM
13 years 11 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
DFT
2008
IEEE
14 years 2 months ago
2008
IEEE
It is widely recognized that device and interconnect fabrics at the nanoscale will be characterized by an increased susceptibility to transient faults. This appears to be intrinsi...