122 search results - page 9 / 25 » Process variability-aware transient fault modeling and analy... |
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
APN
2006
Springer
13 years 11 months ago
2006
Springer
Abstract. In this work, we address the problem of transient and steadystate analysis of a stochastic Petri net which includes non Markovian distributions with a finite support but ...
ICECCS
2009
IEEE
14 years 2 months ago
2009
IEEE
Distributed information systems are critical to the functioning of many businesses; designing them to be dependable is a challenging but important task. We report our experience i...
ICASSP
2011
IEEE
12 years 11 months ago
2011
IEEE
This paper proposes a Bayesian algorithm to estimate the parameters of a smooth transition regression model. With in this model, time series are divided into segments and a linear...
JSS
2008
13 years 7 months ago
2008
Analysis of anomalies reported during testing of a project can tell a lot about how well the processes and products work. Still, organizations rarely use anomaly reports for more t...