Slices as an Abstraction for Cohesion Measurement Linda M. Ott Michigan Technological University James M. Bieman Colorado State University The basis for measuring many attributes ...
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
Most software tools and environments help developers analyze the present and past development states of their software systems. Few approaches have investigated the potential cons...
Yuriy Brun, Reid Holmes, Michael D. Ernst, David N...
For the first time, we demonstrate modulation domain image filters that achieve perceptually motivated image processing goals by directly manipulating the FM functions in a multi-...
Chuong T. Nguyen, Patrick A. Campbell, Joseph P. H...
"Radio Frequency Identification" (RFID) promises to enable an automatic collection of shopping data for business intelligent purposes. Three important components of inte...