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ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
13 years 11 months ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...
INFOCOM
2000
IEEE
13 years 11 months ago
Traffic Engineering Using Multiple Multipoint-to-Point LSPs
Traffic engineering aims to optimize the utilization of existing network resources for load balance and failure recovery, and these are to be accomplished in a scalable fashion. Th...
Hiroyuki Saito, Yasuhiro Miyao, Makiko Yoshida

Lecture Notes
443views
15 years 5 months ago
Design and Analysis of Computer Algorithms
"This course will consist of a number of major sections. The first will be a short review of some preliminary material, including asymptotics, summations, and recurrences and ...
David M. Mount
CEC
2010
IEEE
12 years 11 months ago
A hybrid genetic algorithm for rescue path planning in uncertain adversarial environment
— Efficient vehicle path planning in hostile environment to carry out rescue or tactical logistic missions remains very challenging. Most approaches reported so far relies on key...
Jean Berger, Khaled Jabeur, Abdeslem Boukhtouta, A...
KBSE
2010
IEEE
13 years 6 months ago
Test generation to expose changes in evolving programs
Software constantly undergoes changes throughout its life cycle, and thereby it evolves. As changes are introduced into a code base, we need to make sure that the effect of the ch...
Dawei Qi, Abhik Roychoudhury, Zhenkai Liang