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DFT
2004
IEEE
101views VLSI» more  DFT 2004»
14 years 2 months ago
Designs for Reducing Test Time of Distributed Small Embedded SRAMs
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
Baosheng Wang, Yuejian Wu, André Ivanov
FATES
2006
Springer
14 years 2 months ago
A Test Calculus Framework Applied to Network Security Policies
Abstract. We propose a syntax-driven test generation technique to auly derive abstract test cases from a set of requirements expressed in a linear temporal logic. Assuming that an ...
Yliès Falcone, Jean-Claude Fernandez, Laure...
XPU
2010
Springer
13 years 9 months ago
Automated Acceptance Testing of High Capacity Network Gateway
In this paper we will explore how agile acceptance testing is applied in testing a high capacity network gateway. We will demonstrate how the organisation managed to grow agile acc...
Ran Nyman, Ismo Aro, Roland Wagner
ICST
2008
IEEE
14 years 5 months ago
Distributed In Vivo Testing of Software Applications
The in vivo software testing methodology focuses on testing live applications by executing unit tests throughout the lifecycle, including after deployment. The motivation is that ...
Matt Chu, Christian Murphy, Gail E. Kaiser
FSEN
2007
Springer
14 years 2 months ago
Test Selection Criteria for Quantifier-Free First-Order Specifications
This paper deals with test case selection from axiomatic specifications whose axioms are quantifier-free first-order formulae. Test cases are modeled as ground formulae and any spe...
Marc Aiguier, Agnès Arnould, Pascale Le Gal...