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ISVC
2007
Springer
14 years 5 months ago
ChipViz : Visualizing Memory Chip Test Data
This paper presents a technique that allows test engineers to visually analyze and explore within memory chip test data. We represent the test results from a generation of chips al...
Amit P. Sawant, Ravi Raina, Christopher G. Healey
ASPDAC
2007
ACM
121views Hardware» more  ASPDAC 2007»
14 years 3 months ago
Ultralow-Power Reconfigurable Computing with Complementary Nano-Electromechanical Carbon Nanotube Switches
In recent years, several alternative devices have been proposed to deal with inherent limitation of conventional CMOS devices in terms of scalability at nanometer scale geometry. ...
Swarup Bhunia, Massood Tabib-Azar, Daniel G. Saab
ICCV
2011
IEEE
12 years 11 months ago
Color Photometric Stereo for Multicolored Surfaces
We present a multispectral photometric stereo method for capturing geometry of deforming surfaces. A novel photometric calibration technique allows calibration of scenes containin...
Robert Anderson, Bjorn Stenger, Roberto Cipolla
COMPSAC
2009
IEEE
14 years 3 months ago
Towards a Theory for Testing Non-terminating Programs
Non-terminating programs are programs that legally perform unbounded computations. Though they are ubiquitous in real-world applications, testing these programs requires new theor...
Arnaud Gotlieb, Matthieu Petit
ERSHOV
2009
Springer
14 years 5 months ago
Standardization and Testing of Mathematical Functions
Abstract. The article concerns problems of formulating standard requirements to implementations of mathematical functions working with floating-point numbers and conformance test ...
Victor V. Kuliamin