This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
We point out that the seemingly strong pseudorandom oracle preserving (PRO-Pr) property of hash function domain-extension transforms defined and implemented by Coron et. al. [12] ...
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
Abstract. The paper study counter-dependent pseudorandom number generators based on m-variate (m > 1) ergodic mappings of the space of 2-adic integers Z2. The sequence of intern...