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ITC
2003
IEEE
126views Hardware» more  ITC 2003»
14 years 3 months ago
Convolutional Compaction of Test Responses
This paper introduces a finite memory compactor called convolutional compactor that provides compaction ratios of test responses in excess of 100x even for a very small number of ...
Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M...
DELTA
2002
IEEE
14 years 3 months ago
Test Chirp Signal Generation Using Spectral Warping
A DSP technique that transforms a digital signal by warping the frequency axis is discussed. The technique corresponds to a mapping of the samples in the z-domain such that they a...
Warwick Allen, Donald G. Bailey, Serge N. Demidenk...
IPCV
2008
13 years 11 months ago
Test and Measure of Circularity for Digital Curves
We propose one geometric algorithm to solve both the problem of circularity test and the problem of circularity measure. The former problem consists in deciding whether a given di...
Tristan Roussillon, Isabelle Sivignon, Laure Tougn...
JANCL
2006
112views more  JANCL 2006»
13 years 10 months ago
KAT-ML: an interactive theorem prover for Kleene algebra with tests
We describe KAT-ML, an implementation of an interactive theorem prover for Kleene algebra with tests (KAT). The system is designed to reflect the natural style of reasoning with K...
Kamal Aboul-Hosn, Dexter Kozen
CSDA
2006
85views more  CSDA 2006»
13 years 10 months ago
Detecting change-points in multidimensional stochastic processes
A general test statistic for detecting change-points in multidimensional stochastic processes with unknown parameters is proposed. The test statistic is specialized to the case of...
Jan G. De Gooijer