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ICPR
2000
IEEE
14 years 3 months ago
Nonparametric Markov Random Field Model Analysis of the MeasTex Test Suite
This paper looks at the nonparametric, multiscale, Markov Random Field (MRF) model and its application in classifying the MeasTex Test Suite. The MeasTex Test Suite is a standard ...
Rupert Paget, I. Dennis Longstaff
JAVACARD
2000
14 years 2 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet
TCAD
2002
134views more  TCAD 2002»
13 years 10 months ago
Testing and diagnosis of interconnect faults in cluster-based FPGA architectures
As IC densities are increasing, cluster-based FPGA architectures are becoming the architecture of choice for major FPGA manufacturers. A cluster-based architecture is one in which...
Ian G. Harris, Russell Tessier
DAC
2008
ACM
15 years 5 days ago
Partial order reduction for scalable testing of systemC TLM designs
A SystemC simulation kernel consists of a deterministic implementation of the scheduler, whose specification is nondeterministic. To leverage testing of a SystemC TLM design, we f...
Sudipta Kundu, Malay K. Ganai, Rajesh Gupta
FOCS
2002
IEEE
14 years 4 months ago
A Lower Bound for Testing 3-Colorability in Bounded-Degree Graphs
We consider the problem of testing 3-colorability in the bounded-degree model. We show that, for small enough ε, every tester for 3colorability must have query complexity Ω(n)....
Andrej Bogdanov, Kenji Obata, Luca Trevisan