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ASPDAC
2007
ACM
140views Hardware» more  ASPDAC 2007»
13 years 11 months ago
An Architecture for Combined Test Data Compression and Abort-on-Fail Test
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
Erik Larsson, Jon Persson
ICSM
2007
IEEE
14 years 2 months ago
Combinatorial Interaction Regression Testing: A Study of Test Case Generation and Prioritization
Regression testing is an expensive part of the software maintenance process. Effective regression testing techniques select and order (or prioritize) test cases between successive...
Xiao Qu, Myra B. Cohen, Katherine M. Woolf
AMOST
2007
ACM
13 years 11 months ago
Combining test case generation for component and integration testing
When integrating dierent system components, the interaction between dierent features is often error prone. Typically errors occur on interruption, concurrency or disabling/ enabli...
Sebastian Benz
ICSM
2005
IEEE
14 years 1 months ago
An Empirical Comparison of Test Suite Reduction Techniques for User-Session-Based Testing of Web Applications
Automated cost-effective test strategies are needed to provide reliable, secure, and usable web applications. As a software maintainer updates an application, test cases must accu...
Sara Sprenkle, Sreedevi Sampath, Emily Gibson, Lor...
QSIC
2009
IEEE
14 years 2 months ago
Tag-Based Techniques for Black-Box Test Case Prioritization for Service Testing
—A web service may evolve autonomously, making peer web services in the same service composition uncertain as to whether the evolved behaviors may still be compatible to its orig...
Lijun Mei, W. K. Chan, T. H. Tse, Robert G. Merkel