41 search results - page 7 / 9 » Queuing Models for Field Defect Resolution Process |
CGF
2004
13 years 7 months ago
2004
Individually visible scratches, also called isolated scratches, are very common in real world surfaces. Although their microgeometry is not visible, they are individually percepti...
TVCG
2010
13 years 2 months ago
2010
Efficient multiresolution representations for isosurfaces and interval volumes are becoming increasingly important as the gap between volume data sizes and processing speed continu...
CVPR
2008
IEEE
14 years 9 months ago
2008
IEEE
Studies support the need for high resolution imagery to identify persons in surveillance videos[13]. However, the use of telephoto lenses sacrifices a wider field of view and ther...
PROFES
2001
Springer
13 years 12 months ago
2001
Springer
New information is obtained by research and disseminated by papers in conferences and journals. The synthesis of knowledge depends upon social discourse among the experts in a give...
MICRO
2006
IEEE
13 years 7 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...