2 search results - page 1 / 1 » Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method |
DT
2006
15 years 5 months ago
2006
174
click to vote
ICCAD
2003
IEEE
16 years 1 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...