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» RETNA: From Requirements to Testing in a Natural Way
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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
14 years 21 days ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
IUI
2012
ACM
12 years 4 months ago
Towards automatic functional test execution
As applications are developed, functional tests ensure they continue to function as expected. Nowadays, functional testing is mostly done manually, with human testers verifying a ...
Pablo Pedemonte, Jalal Mahmud, Tessa Lau
IEEESCC
2009
IEEE
14 years 3 months ago
Service Composition Based on Natural Language Requests
—The easiest way for a user to express his needs regarding a desired service is to use natural language. The main issues come from the fact that the natural language is incomplet...
Marcel Cremene, Jean-Yves Tigli, Stephane Lavirott...
RE
2005
Springer
14 years 1 months ago
Using Occurrence Properties of Defect Report Data to Improve Requirements
Defect reports generated for faults found during testing provide a rich source of information regarding problematic phrases used in requirements documents. These reports indicate ...
Kimberly S. Wasson, Kendra N. Schmid, Robyn R. Lut...
LREC
2010
112views Education» more  LREC 2010»
13 years 10 months ago
Principled Construction of Elicited Imitation Tests
In this paper we discuss the methodology behind the construction of elicited imitation (EI) test items. First we examine varying uses for EI tests in research and in testing overa...
Carl Christensen, Ross Hendrickson, Deryle Lonsdal...