28 search results - page 4 / 6 » Real Time Fault Injection Using Logic Emulators |
ETFA
2006
IEEE
14 years 29 days ago
2006
IEEE
♦ To increase the amount of logic available to the users in SRAM-based FPGAs, manufacturers are using nanometric technologies to boost logic density and reduce costs, making its ...
JCIT
2008
13 years 6 months ago
2008
In a Least Developed Country (LDC) like Bangladesh where the textile is the main core of our economy; still there is a major drawback in this sector which is the defect detection ...
ICCAD
2008
IEEE
14 years 3 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
RTAS
2009
IEEE
14 years 1 months ago
2009
IEEE
Embedded systems in safety-critical environments demand safety guarantees while providing many useful services that are too complex to formally verify or fully test. Existing appl...
PRDC
2008
IEEE
14 years 1 months ago
2008
IEEE
Reliability has become a serious concern as systems embrace nanometer technologies. In this paper, we propose a novel approach for organizing redundancy that provides high degree ...