While parallelism and multi-cores are receiving much attention as a major scalability path, customization is another, orthogonal and complementary, scalability path which can targ...
Sami Yehia, Sylvain Girbal, Hugues Berry, Olivier ...
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...