3702 search results - page 132 / 741 » Reducing Misclassification Costs |
SEMWEB
2009
Springer
14 years 4 months ago
2009
Springer
One of the core services provided by OWL reasoners is classification: the discovery of all subclass relationships between class names occurring in an ontology. Discovering these r...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this m...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
HICSS
2008
IEEE
14 years 4 months ago
2008
IEEE
Spinning reserve is idle capacity connected to the system with the purpose of balancing power demand and supply in real-time and ensuring reliable system operations in the case of...
ICIP
2008
IEEE
14 years 4 months ago
2008
IEEE
In this paper, the problem of automatic Gabor wavelet selection for face recognition is tackled by introducing an automatic algorithm based on Parallel AdaBoosting method. Incorpo...