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» Reducing Time Complexity in RFID Systems
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DATE
2008
IEEE
77views Hardware» more  DATE 2008»
14 years 2 months ago
Re-Examining the Use of Network-on-Chip as Test Access Mechanism
Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this m...
Feng Yuan, Lin Huang, Qiang Xu
IROS
2006
IEEE
114views Robotics» more  IROS 2006»
14 years 2 months ago
Orthogonal SLAM: a Step toward Lightweight Indoor Autonomous Navigation
— Today, lightweight SLAM algorithms are needed in many embedded robotic systems. In this paper the Orthogonal SLAM (OrthoSLAM ) algorithm is presented and empirically validated....
Viet Nguyen, Ahad Harati, Agostino Martinelli, Rol...
SIAMSC
2010
142views more  SIAMSC 2010»
13 years 6 months ago
Nested Iteration and First-Order System Least Squares for Incompressible, Resistive Magnetohydrodynamics
This paper develops a nested iteration algorithm to solve time-dependent nonlinear systems of partial differential equations. For each time step, Newton’s method is used to form...
J. H. Adler, Thomas A. Manteuffel, Stephen F. McCo...
TC
2008
13 years 8 months ago
An Efficient and Deadlock-Free Network Reconfiguration Protocol
Component failures and planned component replacements cause changes in the topology and routing paths supplied by the interconnection network of a parallel processor system over ti...
Olav Lysne, José Miguel Montañana, J...
GI
2007
Springer
14 years 2 months ago
Industrial Requirements to Benefit from Test Automation Tools for GUI Testing
: In addition to the growing complexity of software systems, test effort takes increasing amounts of time and correspondingly more money. Testing costs may be reduced without compr...
Christof J. Budnik, Rajesh Subramanyan, Marlon Vie...