387 search results - page 12 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
ENTCS
2007
13 years 7 months ago
2007
Several model-checker based methods to automated test-case generation have been proposed recently. The performance and applicability largely depends on the complexity of the model...
ISSRE
2010
IEEE
13 years 6 months ago
2010
IEEE
—Database-centric applications (DCAs) are common in enterprise computing, and they use nontrivial databases. Testing of DCAs is increasingly outsourced to test centers in order t...
IJCAI
2007
13 years 9 months ago
2007
The paper presents the theoretical foundations and an algorithm to reduce the efforts of testing physical systems. A test is formally described as a set of stimuli (inputs to the ...
INTEGRATION
2006
13 years 7 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...