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» Reducing the Costs of Bounded-Exhaustive Testing
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DEBU
2008
156views more  DEBU 2008»
13 years 7 months ago
Towards Automatic Test Database Generation
Testing is one of the most expensive and time consuming activities in the software development cycle. In order to reduce the cost and the time to market, many approaches to automa...
Carsten Binnig, Donald Kossmann, Eric Lo
FASE
2007
Springer
14 years 1 months ago
Redundancy Based Test-Suite Reduction
The size of a test-suite has a direct impact on the costs and the effort of software testing. Especially during regression testing, when software is re-tested after some modifica...
Gordon Fraser, Franz Wotawa
ICCD
2005
IEEE
131views Hardware» more  ICCD 2005»
14 years 4 months ago
A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs
The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog ...
Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty
EUROMICRO
2007
IEEE
14 years 1 months ago
Using Model Differencing for Architecture-level Regression Testing
Regression testing can be systematically applied at the software architecture level in order to reduce the cost of retesting modified systems, and also to assess the regression t...
Henry Muccini
ITC
1993
IEEE
104views Hardware» more  ITC 1993»
13 years 11 months ago
A BIST Scheme for an SNR Test of a Sigma-Delta ADC
Built-In-Self-Test BIST for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means ...
M. F. Toner, Gordon W. Roberts