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» Reducing the Costs of Bounded-Exhaustive Testing
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ITC
2003
IEEE
106views Hardware» more  ITC 2003»
14 years 27 days ago
Detection of Resistive Shorts in Deep Sub-micron Technologies
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
Bram Kruseman, Stefan van den Oetelaar
ITC
2003
IEEE
176views Hardware» more  ITC 2003»
14 years 27 days ago
Instruction Based BIST for Board/System Level Test of External Memories and Internconnects
ct This paper describes a general technique to test external memory/caches and memory interconnects using on-chip logic. Such a test methodology is expected to significantly reduc...
Olivier Caty, Ismet Bayraktaroglu, Amitava Majumda...
HASE
2002
IEEE
14 years 17 days ago
An Approach to Specify and Test Component-Based Dependable Software
Components (in-house or pre-fabricated) are increasingly being used to reduce the cost of software development. Given that these components may not have not been developed with de...
Arshad Jhumka, Martin Hiller, Neeraj Suri
ECIS
2000
13 years 9 months ago
Functional Integration Test of Mass Processes with Electronic Signatures in Public Administration
Nowadays, almost all public administration plan to establish processes with electronic signatures. For such processes, there are no standardized system models with test cases. We a...
B. Lapken, Frank Losemann, Thomas Engel, Christoph...
JSS
2006
99views more  JSS 2006»
13 years 7 months ago
Software architecture-based regression testing
When architecting dependable systems, in addition to improving system dependability by means of construction (fault-tolerant and redundant mechanisms, for instance), it is also im...
Henry Muccini, Marcio S. Dias, Debra J. Richardson