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» Reducing the Costs of Bounded-Exhaustive Testing
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ITC
2000
IEEE
84views Hardware» more  ITC 2000»
13 years 11 months ago
Non-intrusive BIST for systems-on-a-chip
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wund...
IEEECIT
2010
IEEE
13 years 6 months ago
Porting Mobile Web Application Engine to the Android Platform
Android which Google released as an open-source mobile phone operating system is a Linux-based platform; it consists of the operating system, middleware, and user interface and ap...
Yonghong Wu, Jianchao Luo, Lei Luo
ICSM
2005
IEEE
14 years 1 months ago
A Safe Regression Test Selection Technique for Database-Driven Applications
Regression testing is a widely-used method for checking whether modifications to software systems have adversely affected the overall functionality. This is potentially an expens...
David Willmor, Suzanne M. Embury
JIT
2004
Springer
131views Database» more  JIT 2004»
14 years 1 months ago
Testing of Service-Oriented Architectures - A Practical Approach
Service Oriented Architectures (SOAs) have recently emerged as a new promising paradigm for supporting distributed computing. Web services, as well as integration-packages relying ...
Schahram Dustdar, Stephan Haslinger
ESEC
1997
Springer
13 years 11 months ago
Cryptographic Verification of Test Coverage Claims
The market for software components is growing, driven on the "demand side" by the need for rapid deployment of highly functional products, and on the "supply side&q...
Premkumar T. Devanbu, Stuart G. Stubblebine