387 search results - page 33 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
IOLTS
2000
IEEE
14 years 20 hour ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
IAAI
2003
13 years 9 months ago
2003
In addition to being accurate, it is important that diagnostic systems for use in automobiles also have low development and hardware costs. Model-based methods have shown promise ...
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
Undetectable shorts may decrease the long term reliability of a circuit, cause intermittent failures, add noise and delay, or increase test pattern generation costs. This paper de...
DATE
2000
IEEE
14 years 1 days ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
TASE
2008
IEEE
13 years 7 months ago
2008
IEEE
Maintaining an asset with life-limited parts, e.g., a jet engine or an electric generator, may be costly. Certain costs, e.g., setup cost, can be shared if some parts of the asset ...