387 search results - page 7 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
CGO
2006
IEEE
13 years 11 months ago
2006
IEEE
In this work, we present several compiler optimizations to reduce the overhead due to software protection. We first propose an aggressive rematerialization algorithm which attempt...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
ATS
2002
IEEE
14 years 15 days ago
2002
IEEE
Test planning for core-based system-on-a-chip (SOC) designs is necessary to reduce testing time and test cost. In this paper, we survey recent advances in test planning that addre...
GI
2007
Springer
14 years 1 months ago
2007
Springer
: In addition to the growing complexity of software systems, test effort takes increasing amounts of time and correspondingly more money. Testing costs may be reduced without compr...
ICML
2006
IEEE
14 years 8 months ago
2006
IEEE
In medical diagnosis, doctors often have to order sets of medical tests in sequence in order to make an accurate diagnosis of patient diseases. While doing so they have to make a ...