387 search results - page 9 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
ET
2002
13 years 7 months ago
2002
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
- We propose a dynamic test compaction procedure to generate high-quality test patterns for path delay faults. While the proposed procedure generates a compact two-pattern test set...
AAAI
2012
11 years 10 months ago
2012
Penetration Testing is a methodology for assessing network security, by generating and executing possible hacking attacks. Doing so automatically allows for regular and systematic...
QSIC
2008
IEEE
14 years 1 months ago
2008
IEEE
In the context of open source development or software evolution, developers are often faced with test suites which have been developed with no apparent rationale and which may nee...