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TVLSI
2010
13 years 3 months ago
Pattern Sensitive Placement Perturbation for Manufacturability
The gap between VLSI technology and fabrication technology leads to strong refractive effects in lithography. Consequently, it is a huge challenge to reliably print layout features...
Shiyan Hu, Patrik Shah, Jiang Hu
CORR
2010
Springer
107views Education» more  CORR 2010»
13 years 7 months ago
Maximum Betweenness Centrality: Approximability and Tractable Cases
The Maximum Betweenness Centrality problem (MBC) can be defined as follows. Given a graph find a k-element node set C that maximizes the probability of detecting communication be...
Martin Fink, Joachim Spoerhase
CORR
2011
Springer
243views Education» more  CORR 2011»
13 years 3 months ago
Localization from Incomplete Noisy Distance Measurements
—We consider the problem of positioning a cloud of points in the Euclidean space Rd , from noisy measurements of a subset of pairwise distances. This task has applications in var...
Adel Javanmard, Andrea Montanari
CORR
2010
Springer
160views Education» more  CORR 2010»
13 years 9 months ago
New Results on Quantum Property Testing
We present several new examples of speed-ups obtainable by quantum algorithms in the context of property testing. First, motivated by sampling algorithms, we consider probability d...
Sourav Chakraborty, Eldar Fischer, Arie Matsliah, ...

Book
296views
15 years 7 months ago
Implementing Functional Languages: a tutorial
"This book gives a practical approach to understanding implementations of non-strict functional languages using lazy graph reduction. The book is intended to be a source of pr...
Simon Peyton Jones, David Lester