128 search results - page 14 / 26 » Relationships between Test Suites, Faults, and Fault Detecti... |
ITC
2003
IEEE
14 years 19 days ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
FORTE
2000
13 years 8 months ago
2000
The paper addresses the problem of test derivation from partially defined specifications. A specification is modeled by an Input/Output FSM such that transitions from some states ...
APSEC
2010
IEEE
13 years 2 months ago
2010
IEEE
Abstract--Real-time embedded systems (RTESs) are becoming increasingly ubiquitous, controlling a wide variety of popular and safety-critical devices. Effective testing techniques c...
TAICPART
2010
IEEE
13 years 5 months ago
2010
IEEE
Abstract. With pairwise testing, the test model is a list of N parameters. Each test case is an N-tuple; the test space is the cross product of the N parameters. A pairwise test is...
ASYNC
2000
IEEE
13 years 11 months ago
2000
IEEE
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...