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ICSM
2005
IEEE
14 years 28 days ago
Test Suite Reduction with Selective Redundancy
Software testing is a critical part of software development. Test suite sizes may grow significantly with subsequent modifications to the software over time. Due to time and res...
Dennis Jeffrey, Neelam Gupta
SIGSOFT
1998
ACM
13 years 11 months ago
Further Empirical Studies of Test Effectiveness
This paper reports on an empirical evaluation of the fault-detecting ability of two white-box software testing techniques: decision coverage (branch testing) and the all-uses data...
Phyllis G. Frankl, Oleg Iakounenko
VTS
1996
IEEE
112views Hardware» more  VTS 1996»
13 years 11 months ago
Optimal voltage testing for physically-based faults
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
Yuyun Liao, D. M. H. Walker
ICCAD
1991
IEEE
135views Hardware» more  ICCAD 1991»
13 years 11 months ago
DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
Torsten Grüning, Udo Mahlstedt, Hartmut Koopm...
ICST
2008
IEEE
14 years 1 months ago
Prioritizing User-Session-Based Test Cases for Web Applications Testing
Web applications have rapidly become a critical part of business for many organizations. However, increased usage of web applications has not been reciprocated with corresponding ...
Sreedevi Sampath, Renée C. Bryce, Gokulanan...