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ET
2006
120views more  ET 2006»
13 years 7 months ago
Automatic Test Pattern Generation for Resistive Bridging Faults
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced s...
Piet Engelke, Ilia Polian, Michel Renovell, Bernd ...
WWW
2007
ACM
14 years 8 months ago
A fault model and mutation testing of access control policies
To increase confidence in the correctness of specified policies, policy developers can conduct policy testing by supplying typical test inputs (requests) and subsequently checking...
Evan Martin, Tao Xie
ICSE
2003
IEEE-ACM
14 years 7 months ago
Improving Test Suites via Operational Abstraction
g Test Suites via Operational Abstraction Michael Harder Jeff Mellen Michael D. Ernst MIT Lab for Computer Science 200 Technology Square Cambridge, MA 02139 USA {mharder,jeffm,mern...
Michael Harder, Jeff Mellen, Michael D. Ernst
SIGSOFT
2007
ACM
14 years 8 months ago
Test suite prioritization by interaction coverage
Event-driven software (EDS) is a widely used class of software that takes sequences of events as input, changes state, and outputs new event sequences. Managing the size of tests ...
Renée C. Bryce, Atif M. Memon
ICSE
2007
IEEE-ACM
14 years 7 months ago
Using GUI Run-Time State as Feedback to Generate Test Cases
This paper presents a new automated model-driven technique to generate test cases by using feedback from the execution of a "seed test suite" on an application under tes...
Xun Yuan, Atif M. Memon