128 search results - page 9 / 26 » Relationships between Test Suites, Faults, and Fault Detecti... |
ICSE
2008
IEEE-ACM
14 years 8 months ago
2008
IEEE-ACM
Fault-localization techniques that utilize information about all test cases in a test suite have been presented. These techniques use various approaches to identify the likely fau...
ERLANG
2008
ACM
13 years 9 months ago
2008
ACM
Current and future trends for software include increasingly complex requirements on interaction between systems. As a result, the difficulty of system testing increases. Model-bas...
ISSRE
2002
IEEE
14 years 8 days ago
2002
IEEE
Object-oriented programs cause a shift in focus from software units to the way software classes and components are connected. Thus, we are finding that we need less emphasis on un...
ATS
2000
IEEE
13 years 11 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
ITC
2003
IEEE
14 years 18 days ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...