A new method for hierarchical fault simulation based on multi-level Decision Diagrams (DD) is proposed. We suppose that a register transfer (RT) level information along with gate-...
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
Time series are an important type of data with applications in virtually every aspect of the real world. Often a large number of time series have to be monitored and analyzed in p...
Ming C. Hao, Umeshwar Dayal, Daniel A. Keim, Tobia...
A method for approximate subsequence matching is introduced, that significantly improves the efficiency of subsequence matching in large time series data sets under the dynamic ti...
Recent work on temporal relation identification has focused on three types of relations between events: temporal relations between an event and a time expression, between a pair o...
Katsumasa Yoshikawa, Sebastian Riedel, Masayuki As...