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» Reliability Analysis of Concurrent Systems Using LTSA
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ISQED
2010
IEEE
156views Hardware» more  ISQED 2010»
13 years 9 months ago
On the design of different concurrent EDC schemes for S-Box and GF(p)
Recent studies have shown that an attacker can retrieve confidential information from cryptographic hardware (e.g. the secret key) by introducing internal faults. A secure and re...
Jimson Mathew, Hafizur Rahaman, Abusaleh M. Jabir,...
TACAS
2007
Springer
165views Algorithms» more  TACAS 2007»
14 years 1 months ago
Unfolding Concurrent Well-Structured Transition Systems
Abstract. Our main objective is to combine partial-order methods with verification techniques for infinite-state systems in order to obtain efficient verification algorithms fo...
Frédéric Herbreteau, Grégoire...
VEE
2012
ACM
269views Virtualization» more  VEE 2012»
12 years 3 months ago
SimTester: a controllable and observable testing framework for embedded systems
In software for embedded systems, the frequent use of interrupts for timing, sensing, and I/O processing can cause concurrency faults to occur due to interactions between applicat...
Tingting Yu, Witawas Srisa-an, Gregg Rothermel
PRDC
2007
IEEE
14 years 1 months ago
Improving Dependability Using Shared Supplementary Memory and Opportunistic Micro Rejuvenation in Multi-tasking Embedded Systems
We propose a comprehensive solution to handle memory-overflow problems in multitasking embedded systems thereby improving their reliability and availability. In particular, we pro...
Vinaitheerthan Sundaram, Sandip HomChaudhuri, Sach...
IPPS
2010
IEEE
13 years 5 months ago
Parallel I/O performance: From events to ensembles
Parallel I/O is fast becoming a bottleneck to the research agendas of many users of extreme scale parallel computers. The principle cause of this is the concurrency explosion of hi...
Andrew Uselton, Mark Howison, Nicholas J. Wright, ...