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IOLTS
2008
IEEE
117views Hardware» more  IOLTS 2008»
14 years 1 months ago
Verification and Analysis of Self-Checking Properties through ATPG
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
Marc Hunger, Sybille Hellebrand
JPDC
2006
112views more  JPDC 2006»
13 years 7 months ago
CEFT: A cost-effective, fault-tolerant parallel virtual file system
The vulnerability of computer nodes due to component failures is a critical issue for cluster-based file systems. This paper studies the development and deployment of mirroring in...
Yifeng Zhu, Hong Jiang
DAC
2005
ACM
14 years 8 months ago
High performance computing on fault-prone nanotechnologies: novel microarchitecture techniques exploiting reliability-delay trad
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...
Andrey V. Zykov, Elias Mizan, Margarida F. Jacome,...
CASES
2009
ACM
14 years 1 days ago
Complete nanowire crossbar framework optimized for the multi-spacer patterning technique
Nanowire crossbar circuits are an emerging architectural paradigm that promises a higher integration density and an improved fault-tolerance due to its reconfigurability. In this...
M. Haykel Ben Jamaa, Gianfranco Cerofolini, Yusuf ...
CODES
2011
IEEE
12 years 7 months ago
Analysis and optimization of fault-tolerant task scheduling on multiprocessor embedded systems
Reliability is a major requirement for most safety-related systems. To meet this requirement, fault-tolerant techniques such as hardware replication and software re-execution are ...
Jia Huang, Jan Olaf Blech, Andreas Raabe, Christia...