492 search results - page 57 / 99 » Reliability and Fault Tolerance in Trust |
SPDP
1993
IEEE
14 years 24 days ago
1993
IEEE
This paper presents a solution to the (processor) group membership problem. The methodology followed in designing the algorithm is summarized by the option to optimize the perform...
DAC
2007
ACM
14 years 9 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2009
ACM
14 years 9 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
CODES
2009
IEEE
14 years 3 months ago
2009
IEEE
This paper presents a system-level design methodology for networked embedded systems that exploits existing data-redundancy to increase their reliability. The presented approach n...
ASAP
2005
IEEE
14 years 2 months ago
2005
IEEE
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...