282 search results - page 10 / 57 » Reliability- and process-variation aware design of integrate... |
DATE
2010
IEEE
14 years 3 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
MR
2007
13 years 9 months ago
2007
CDM ESD event has become the main ESD reliability concern for integrated-circuits products using nanoscale CMOS technology. A novel CDM ESD protection design, using self-biased cu...
DATE
2010
IEEE
14 years 3 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
DAC
2005
ACM
14 years 11 months ago
2005
ACM
We present a new methodology which takes into consideration the effect of Within-Die (WID) process variations on a low-voltage parallel system. We show that in the presence of pro...
ISLPED
2009
ACM
14 years 4 months ago
2009
ACM
Post-fabrication tuning for mitigating manufacturing variability is receiving a significant attention. To reduce leakage increase involved in performance compensation by body bia...