282 search results - page 40 / 57 » Reliability- and process-variation aware design of integrate... |
FPGA
2004
ACM
14 years 2 months ago
2004
ACM
As FPGA densities increase, partitioning-based FPGA placement approaches are becoming increasingly important as they can be used to provide high-quality and computationally scalab...
DAC
2009
ACM
14 years 10 months ago
2009
ACM
Elevated chip temperatures are true limiters to the scalability of computing systems. Excessive runtime thermal variations compromise the performance and reliability of integrated...
INTEGRATION
2008
13 years 9 months ago
2008
Thermal gradients across the die are becoming increasingly prominent as we scale further down into the sub-nanometer regime. While temperature was never a primary concern, its non...
GLVLSI
2005
IEEE
14 years 2 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
DFT
1999
IEEE
14 years 1 months ago
1999
IEEE
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...