As CMOS devices are scaled down into the nanometer regime, concerns about reliability are mounting. Instead of viewing nanoscale characteristics as an impediment, technologies suc...
Weikang Qian, Marc D. Riedel, Kia Bazargan, David ...
The Multidimensional Assignment Problem (MAP) is an NP-hard combinatorial optimization problem occurring in many applications, such as data association, target tracking, and resou...
Don A. Grundel, Pavlo A. Krokhmal, Carlos A. S. Ol...
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
Path-oriented Random Testing (PRT) aims at generating a uniformly spread out sequence of random test data that activate a single control flow path within an imperative program. T...
We initiate a general study of pseudo-random implementations of huge random objects, and apply it to a few areas in which random objects occur naturally. For example, a random obj...