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» Reusable test collections through experimental design
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IPPS
1998
IEEE
13 years 12 months ago
Memory Space Representation for Heterogeneous Network Process Migration
A major difficulty of heterogeneous process migration is how to collect advanced dynamic data-structures, transform them into machine independent form, and restor them appropriate...
Kasidit Chanchio, Xian-He Sun
ICPR
2004
IEEE
14 years 8 months ago
Resampling for Face Detection by Self-Adaptive Genetic Algorithm
Over the past ten years, face detection has been thoroughly studied in computer vision research for its interesting applications. However, all of the state-of-the-art statistical ...
Jie Chen, Wen Gao, Xilin Chen
CCS
2003
ACM
14 years 27 days ago
Using graphic turing tests to counter automated DDoS attacks against web servers
We present WebSOS, a novel overlay-based architecture that provides guaranteed access to a web server that is targeted by a denial of service (DoS) attack. Our approach exploits t...
William G. Morein, Angelos Stavrou, Debra L. Cook,...
DATE
2002
IEEE
99views Hardware» more  DATE 2002»
14 years 19 days ago
Gate Level Fault Diagnosis in Scan-Based BIST
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...
Ismet Bayraktaroglu, Alex Orailoglu
KDD
2008
ACM
259views Data Mining» more  KDD 2008»
14 years 8 months ago
Using ghost edges for classification in sparsely labeled networks
We address the problem of classification in partially labeled networks (a.k.a. within-network classification) where observed class labels are sparse. Techniques for statistical re...
Brian Gallagher, Hanghang Tong, Tina Eliassi-Rad, ...