303 search results - page 23 / 61 » Robust Test Generation and Coverage for Hybrid Systems |
TASE
2011
IEEE
12 years 11 months ago
2011
IEEE
Abstract—A fast offset surface generation approach is presented in this paper to construct intersection-free offset surfaces, which preserve sharp features, from freeform triangu...
VLDB
1998
ACM
13 years 12 months ago
1998
ACM
Deterministic testing of SQL database systems is human intensive and cannot adequately cover the SQL input domain. A system (RAGS), was built to stochastically generate valid SQL ...
EVOW
2006
Springer
13 years 11 months ago
2006
Springer
Abstract. We motivate and describe an analog evolvable hardware design platform named GRACE (i.e. Generative Robust Analog Circuit Exploration). GRACE combines coarse-grained, topo...
HYBRID
2010
Springer
14 years 2 months ago
2010
Springer
The main purpose of event-based control, if compared to periodic control, is to minimize data transfer or processing power in networked control systems. Current methods have an (i...
VTS
1999
IEEE
13 years 12 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...