303 search results - page 8 / 61 » Robust Test Generation and Coverage for Hybrid Systems |
ECBS
2010
IEEE
14 years 29 days ago
2010
IEEE
The Uniļ¬ed Modeling Language (UML) is the standard to specify the structure and behaviour of software systems. The created models are a constitutive part of the software speciļ¬...
VTS
2002
IEEE
14 years 17 days ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
VL
2006
IEEE
14 years 1 months ago
2006
IEEE
In this paper we present a system that helps users test their spreadsheets using automatically generated test cases. The system generates the test cases by backward propagation an...
CDC
2008
IEEE
14 years 2 months ago
2008
IEEE
ā In this paper we propose a testing based method for safety/ reachability analysis of stochastic hybrid systems. Testing based methods are characterized by analysis based on the...
IOLTS
2000
IEEE
14 years 1 days ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...