Sciweavers

768 search results - page 74 / 154
» Robustness of Sequential Circuits
Sort
View
DAC
1995
ACM
14 years 10 days ago
Extreme Delay Sensitivity and the Worst-Case Switching Activity in VLSI Circuits
Abstract We observe that the switching activity at a circuit node, also called the transition density, can be extremely sensitive to the circuit internal delays. As a result, sligh...
Farid N. Najm, Michael Y. Zhang
EH
2000
IEEE
81views Hardware» more  EH 2000»
14 years 1 months ago
Toward Self-Repairing and Self-Replicating Hardware: The Embryonics Approach
The growth and operation of all living beings are directed by the interpretation, in each of their cells, of a chemical program, the DNA string or genome. This process is the sour...
Daniel Mange, Moshe Sipper, André Stauffer,...
EH
2004
IEEE
102views Hardware» more  EH 2004»
14 years 15 days ago
Circuit Self-Recovery Experiments in Extreme Environments
Temperature and radiation tolerant electronics, as well as long life survivability are key capabilities required for future NASA missions. Current approaches to electronics for ex...
Adrian Stoica, Didier Keymeulen, Tughrul Arslan, V...
ISLPED
2006
ACM
129views Hardware» more  ISLPED 2006»
14 years 2 months ago
Variation-driven device sizing for minimum energy sub-threshold circuits
Sub-threshold operation is a compelling approach for energyconstrained applications, but increased sensitivity to variation must be mitigated. We explore variability metrics and t...
Joyce Kwong, Anantha P. Chandrakasan
ICCAD
2002
IEEE
107views Hardware» more  ICCAD 2002»
14 years 5 months ago
Characteristic faults and spectral information for logic BIST
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspeciļ¬c spectral information in th...
Xiaoding Chen, Michael S. Hsiao